The facility is equiped with a FIB-SEM (Focused Ion Beam-Scanning Electron Microscopy), that allows volumic acquisition of resin embedded samples at nanometric resolution (up to 5nm in 3D). This technology allows observation in 3D of whole cells, small organisms and tissus. FIB-SEM can be combined to light microscopy to link functional characterization, thanks to light microscopy, to structure with electron microscopy data. The Imagerie-Gif facility proposed to combine high resolution light microscopy to volumic electron microscopy by combinin a SIM (Structured Illumination Microscopy) and a FIB-SEM.