Transmission Electron Microscopy – TEM and Correlative Light Electron Microscopy – CLEM

Our imaging platform has acquired a TEM workstation, which will be installed in July 2025. This new system will open up new possibilities for our users, enabling them to observe samples with sub-nanometric resolution and magnifications of up to one million times. Coupled with our existing photonic systems, and in particular our super-resolution airyscan microscope, this new scop will make it possible to carry out CLEM experiments, enabling the same structure to be studied under light microscopy, taking advantage of its specific labelling and the possibility of observing living samples, and under electron microscopy to exploit its power of resolution and magnification.