2D or 3D electron microscopy morphometric analysis of the central nervous system with Deep FIB-SEM and IA-based image analysis
Technology: Focused Ion Beam SEM (FIB-SEM)
Uses an ion beam to mill the sample while SEM images the exposed surfaces, enabling precise 3D reconstructions.
Full workflow support on surface morphology and ultrastructural analysis in SEM and TEM
The facility is equiped with a FIB-SEM (Focused Ion Beam-Scanning Electron Microscopy), that allows volumic acquisition of resin embedded samples at nanometric resolution (up to 5nm in 3D). This technology allows observation in 3D of whole cells, small organisms and tissus. FIB-SEM can be combined to light microscopy to link functional characterization, thanks to light microscopy, to structure with electron microscopy data. The Imagerie-Gif facility proposed to combine high resolution light microscopy to volumic electron microscopy by combinin a SIM (Structured Illumination Microscopy) and a FIB-SEM.