The Working Group ‘Metrology methods in Microscopy’ from the french Multi-dimensional Fluorescence photonic Microscopy Technological Network (RTmfm) of the CNRS Mission for Interdisciplinarity organizes a thematic workshop entitled ‘From standard metrology to super-resolution metrology’. It will be held from the 1st to 3rd of December 2015, in Bordeaux (33).

More information: Atelier-thematique-de-metrologie-2015-programme

Registration: https://services.aquitaine.cnrs.fr/limesurvey/index.php/757899/lang-fr

Registration deadline: 11th november 2015 (number of participants limited to 15)